Speaker
Description
As BESSY II uses complex filling patterns for standard operation as well as other modes of operation, it is necessary to have bunch-resolved diagnostic tools. While a streak camera has been successfully used for the longitudinal electron-beam diagnostics a fast-gated ICCD camera is being implemented on the neighbouring beamline to provide bunch-resolved diagnostics in the transverse directions. Both beamlines use visible light from a bending magnet, which severely limits transverse diagnostic resolution using direct imaging. However, the use of optical interferometry can significantly increase the spatial resolution. Implementing the interferometric method with the fast-gated ICCD camera resulted in an unexpected behaviour of the measured interference patterns that differ from the corresponding results obtained with a slow CCD camera. In my talk, I will try to explain the problem in more detail with the aim of allowing a fruitful discussion to take place.
