Speaker
Description
The feasibility of using X-ray Fresnel Diffractometry to measure small beam sizes beyond the resolution of the X-ray pinhole cameras is studied. X-ray Fresnel diffractometry employs a single slit with optimised width that produces a double lobe diffraction pattern. The visibility of this double lobe intensity distribution relates to the beam size and promises micron-scale beam size measurement. To test this method at Diamond, a screen produced by LIGA (i.e. X-ray lithography, electroplating and molding) with different slit widths is used. Numerical studies and SRW simulations were conducted to select the optimal photon energy for the available slit widths, the expected diffraction pattern for different beam sizes, and the required distances between the source-to-slit and slit-to-scintillator for the case of Diamond. Results, challenges, and future plans are presented.
